17. Dez 2021, 08:15 - 09:00: Cryoelectron Microscopy & Serial Block Face SEM (1)

Artefacts commonly happening during conventional TEM preparation; Physico-chemical origin of these artefacts; Rationale for applying cryo-EM; Meaning of vitrification and ways of achieving it; Principles of single particle cryo-EM; Pros and Cons vs X-ray crystallography; Principles of cryo-electron tomography; Rationale for applying SBF-SEM; Principle of SBF-SEM procedure; Pros and Cons vs TEM serial sections; Segmentations: pitfalls and arising methods